Radiation Damage Processes in Silicon,
Abstract
The basic objective is to understand the electronic properties of simple point lattice defects in the silicon lattice, the mechanisms by which they are formed, and the processes by which they can migrate through the lattice and react with other defects to form complexes.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1981
- Accession Number
- ADA107170
Entities
People
- George D. Watkins
Organizations
- Lehigh University