Accelerated Life Testing Under Competing Exponential Failure Distributions.

Abstract

Accelerated life testing of a product is commonly used to estimate parameters of devices with extremely long lifelines. The problem of analyzing accelerated life tests when the product can fail from any one of p independent causes is considered. For each component it is assumed that the time to failure distribution is exponential with a hazard rate which follows a 'power rule.' The method of maximum likelihood is used to obtain estimators of the power rule parameters when the life test is either type I, type II, or progressively censored. Estimators of each component's mean failure time and survival function are obtained. Estimators of system or subsystem survival functions are also obtained. Results of a simulation study are presented. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1981
Accession Number
ADA107626

Entities

People

  • Asit P. Basu
  • John P. Klein

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Algorithms
  • Asymptotic Normality
  • Data Science
  • Estimators
  • Failure Mode And Effect Analysis
  • Information Science
  • Intervals
  • Life Tests
  • Long Life
  • Maximum Likelihood Estimation
  • Normality
  • Random Variables
  • Reliability
  • Simulations
  • Statistical Algorithms
  • Statistics
  • Survival

Fields of Study

  • Mathematics

Readers

  • Statistical inference.