Built-In-Test Equipment Requirements Workshop. Workshop Presentation
Abstract
A workshop was held for the purpose of assessing progress and problems in specifying and testing Built-In-Test (BIT) used in complex electronic equipment. The workshop's principal recommendation is that the current specification and test approach be broadened to include all capabilities associated with the detection and isolation of faults. Current practices generally address only a narrow subset of these capabilities, namely, BIT. The workshop participants defined this broad capability as '100 Percent Diagnostics. ' The diagnostic capability is considered to have two components--'automatic' and 'manual.' The automatic component consists of BIT or semi-automatic BIT with technical manuals, while the manual component consists of personnel using logic, external test equipment and/or manual test procedures. Observations on current experience with BIT, recommendations to improve specification and testing of '100 Percent Diagnostics' that can be put into practice in the near term, and proposed research areas are presented.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1981
- Accession Number
- ADA107842
Entities
Organizations
- Institute for Defense Analyses