Corrosion Control Test Method for Avionic Components

Abstract

The program objective was to develop an accelerated laboratory corrosion test capable of simulating the severe corrosive effects of an aircraft carrier deployment environment. The current standard 5% salt fog test is not severe enough to simulate the carrier environment, thus limiting its usefulness in forecasting corrosion failures. To provide test standards, representaive electrical and electronic units were exposed on an oil burning carrier during a 9 month tropical cruise and on a nuclear carrier during a 10 month tropical cruise. A series of laboratory tests were run to identify corrosion environments which provide good correlation with actual carrier results. The tests were also judged on their ability to promote moisture related electrical failures. During the final phase of the program, 25 electronic and electrical components were exposed to the two most promising test methods. The selected test method is a modification of the NADC sulfur dioxide salt fog test. It utilizes a much higher exposure temperatuer and a dilute substitute ocean water solution for fog generaion. In one week this test method produces both corrosion damage and electrial failures that correlate with the condition of the test articles exposed for nine to ten months on an aircraft carrier. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Sep 25, 1981
Accession Number
ADA108061

Entities

People

  • A. W. Morris

Organizations

  • McDonnell Aircraft Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • C4I
  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Aircraft Carriers
  • Aircraft Equipment
  • Aircrafts
  • Capacitance
  • Circuit Boards
  • Corrosion
  • Dielectric Gases
  • Dielectrics
  • Electrical Properties
  • Environment
  • Fungi
  • Laboratory Tests
  • Materials
  • Printed Circuits
  • Salt Spray Tests
  • Standards
  • Test Methods

Readers

  • Aerospace Engineering
  • Aerospace Test and Evaluation
  • Materials Science and Engineering.

Technology Areas

  • Microelectronics