Hardness Assurance Latchup Test Procedure.

Abstract

This test procedure defines the detailed requirements for gamma dose rate testing of semiconductor integrated circuits to determine if they are susceptible to radiation-induced latchup. This test is not deleterious, and devices which have been subjected to and passed the test may be used as production hardware. There are two types of radiation-induced latchup: (1) a hard latchup, and (2) an incipient latchup. A hard latchup is a sustained functional failure. The erroneous operational condition can be stopped by cycling bias power if burnout has not occurred in the interim. Incipient latchup is characterized by a functional failure which is not sustained, but which lasts longer than can be explained by normal circuit time constants. Identification of a latchup-susceptible IC is accomplished by identifying erroneous operating states immediately after radiation exposure by exercising the device with a functional test.

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Document Details

Document Type
Technical Report
Publication Date
Aug 28, 1978
Accession Number
ADA109691

Entities

People

  • A. A. Witteles

Tags

Communities of Interest

  • Biomedical
  • Energy and Power Technologies
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force
  • Circuits
  • Classification
  • Contractors
  • Department Of Defense
  • Digital Circuits
  • Dose Rate
  • Dosimetry
  • Identification
  • Instrumentation
  • Integrated Circuits
  • Large Scale Integrated Circuits
  • Linear Accelerators
  • Power Supplies
  • Radiation
  • Security
  • Semiconductors

Fields of Study

  • Physics

Readers

  • Educational Psychology
  • Integrated Circuit Design and Technology.
  • Software Engineering

Technology Areas

  • Microelectronics