Nuclear Transmutation Doping of GaAs.

Abstract

Shallow donors have been introduced into GaAs crystals by irradiation with thermal neutrons and subsequent nuclear transmutation. Good agreement was found between the measured concentrations of added donors and the values expected from the neutron capture cross sections and the neutron fluences used. This doping method is approximately 1000 times more efficient in GaAs than in Si because of the higher abundances and neutron capture cross sections of the transmutable isotopes in GaAs. In epitaxially grown GaAs of high purity, the recoil and radiation damage associated with transmutation doping can be removed by annealing at about 600 C which is below the critical temperature for As effusion. The electronic transport properties of transmutation doped GaAs samples were studied between 1.4 and 450K of concentrations both above and below the metal-nonmetal transition. We found that transmutation doping is a convenient method for introducing a desired concentration of shallow donors into GaAs crystals for modifying their electronic properties.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1981
Accession Number
ADA110433

Entities

People

  • Hans Fritzsche

Organizations

  • University of Chicago

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Critical Temperature
  • Crystal Lattice Vibrations
  • Electrical Properties
  • Electrons
  • Fermi Levels
  • Low Temperature
  • Magnetic Fields
  • Materials
  • Metal-Insulator Transitions
  • Neutron Capture
  • Nuclear Reactions
  • Nuclear Transmutation
  • Radiation
  • Semiconductors
  • Solid State Physics
  • Thermal Neutrons
  • Transport Properties

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Semiconductor Device Technology
  • Solar Physics

Technology Areas

  • Microelectronics