Performance Limits on GaAs FET Large- and Small-Signal Circuits.
Abstract
A describing function approach to large-signal frequency-domain simulations of nonlinear microwave circuits is presented. It is used to examine gain saturation and harmonic distortion of a 0.5 micron gate FET. The simulation uses a previously reported FET model, modified to include gate breakdown and substrate leakage current. Temperature effects are studied. It is found that gain saturation does not depend on gate breakdown. The model is verified by comparing theoretical and experimental performance. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1981
- Accession Number
- ADA110736
Entities
People
- D. R. Green Jr.
- F. R. Rosenbaum
Organizations
- University of Washington