Topics in Optical Materials and Device Research - II. Volume II.

Abstract

A new analysis of fiber-optic wavelength multiplexing was developed. A study of the limitations imposed by materials quality on CCD's was carried out. The SiO2-Si interface and its problems were investigated. Epitaxial growth mechanism for silicon, silicon nitride, and silicon dioxide were studied. A theory was developed to describe time-domain reflectometry return signals. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1982
Accession Number
ADA111481

Entities

People

  • C. E. Ryan
  • H. Haskel
  • R. V. Wood
  • Stanford P. Yukon
  • T. B. Barrett

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Cameras
  • Ceramic Materials
  • Computer Programming
  • Computer Programs
  • Computers
  • Data Storage Systems
  • Data Transmission
  • Diagrams
  • Directories
  • Epitaxial Growth
  • Ground State
  • Materials
  • Operating Systems
  • Optical Materials
  • Standards
  • Time-Domain Reflectometry
  • Transitions

Readers

  • Image Processing and Computer Vision.
  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Thin Film Deposition Science.