Topics in Optical Materials and Device Research - II. Volume I.

Abstract

A new analysis of fiber-optic wavelength multiplexing was developed. A study of the limitations imposed by materials quality on CCD's was carried out. The SiO2-Si interface and its problems were investigated. Expitaxial growth mechanism for silicon, silicon nitride, and silicon dioxide were studied. A theory was developed to describe time-domain reflectometry return signals. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1982
Accession Number
ADA111762

Entities

People

  • C. E. Ryan
  • H. Haskel
  • R. V. Wood
  • Stanford P. Yukon
  • T. B. Barrett

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Ceramic Materials
  • Chemical Vapor Deposition
  • Crystal Growth
  • Differential Equations
  • Diffraction
  • Fabrication
  • Fiber Optics
  • Fresnel Zones
  • Geometry
  • Materials
  • Optical Fibers
  • Optical Materials
  • Optical Properties
  • Optics
  • Refractive Index
  • Scattering
  • Very Large Scale Integration

Readers

  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design
  • Thin Film Deposition Science.