Latent Trait Model Contributions to Criterion-Referenced Testing Technology.
Abstract
The goals and results of an 18-month study addressing latent trait model applications to measurement problems arising in criterion-referenced testing are presented. The research studies described in the report cover the following areas: (a) problems with classical test models; introduction to latent trait models, features, assumptions, parameter estimation, and test and item information curves; building tests with latent trait models; (b) latent ability scales - uses, interpretations, and properties; equating test scores for using a common set of norms tables; approaches for addressing the goodness of fit between a latent trait model and a data set; (c) comparing the one-parameter and three-parameter logistic models for ability estimation and decision-making with several test lengths and ability levels; (d) determining the optimal length of criterion-referenced tests with different types of item pools (varying the level of item heterogeneity) and using two different item selection methods; (e) a system to allow instructors to specify required level of measurement precision and obtain information to help them determine test length; (f) comparing the fit of the one-parameter and three-parameter models to 25 sets of test data; and (g) building banks of valid test items. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1982
- Accession Number
- ADA112048
Entities
People
- Ronald K. Hambleton
Organizations
- University of Massachusetts Amherst