Retroreflective Phase Retardation Prisms.

Abstract

A retroreflecting device with controlled phase retardation can be made by coating each reflecting surface of a porro prism with a single dielectric film. The amount of phase retardation is a function of the refractive index of the prism, the refractive index of the film and the film thickness. The retardation introduced can be readily controlled in the range of zero to pi radians using readily available materials. The materials used are not birefringent. Two phase retardation prisms have been made and evaluated. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1981
Accession Number
ADA112220

Entities

People

  • J. R. Venning

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Angle Of Incidence
  • Dielectric Films
  • Dielectrics
  • Electro-Optics
  • Electromagnetic Radiation
  • Evanescent Waves
  • Films
  • Laser Resonators
  • Materials
  • Optical Equipment
  • Optical Properties
  • Optics
  • Refractive Index
  • Thickness
  • Thin Films
  • Total Internal Reflection
  • Waveplates

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Thin Film Deposition Science.