Silicon Nitride Joining.

Abstract

The objective of this program is to investigate joining of ceramics through reactions between oxynitride melts and silicon nitride. The basis of the approach is to use joining materials that duplicate the composition of intergranular phases that exist in different types of hot-pressed or sintered Si3N4. A method has been devised to calculate average intergranular compositions from bulk analysis of Si3N4. Calculated compositions are similar to those determined by analytical electron microscopy. Oxynitrides that simulate the grain boundary phases in NC132 and NCX34 hot-pressed Si3N4 were prepared and used in joining experiments. The minimum joint thickness was 15 microseconds. The integrity of the joints is strongly dependent on the composition of the joining material and on the reaction temperature, but appears independent of the pressure of the nitrogen atmosphere, between 30 and 300 psi. Transmission electron microscopy studies of joined materials suggest that the liquid bonding material reacts with the ceramic surface, dissolving Si3N4 and penetrating into the ceramic. At the same time silicon oxynitride laths grow across the interface to form the joint. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Feb 08, 1982
Accession Number
ADA113977

Entities

People

  • D. J. Rowcliffe
  • M. L. Mecartney
  • R. E. Loehman

Organizations

  • SRI International

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Amorphous Materials
  • Ceramic Materials
  • Composite Materials
  • Diffraction
  • Electron Diffraction
  • Electron Microscopes
  • Electron Microscopy
  • Elements
  • Glass
  • Glass Transition Temperature
  • Grain Boundaries
  • Materials
  • Materials Science
  • Microscopy
  • Transition Temperature
  • Transmission Electron Microscopy

Fields of Study

  • Materials science

Readers

  • Explosive Engineering.
  • Powder metallurgy of Titanium alloys.
  • Reinforced Composite Materials

Technology Areas

  • Microelectronics