Microcircuit Device Reliability. Digital Failure Rate Data
Abstract
This report concerns itself with the presentation and analysis of digital microcircuit reliability data, which has been compiled from a wide spectrum of military and commercial sources. The individual data elements represent both component life test and equipment reliability demonstration results, as well as actual field experience. For analysis purposes, this report separates these sources into two major sections. The first section presents the summarized results of test and field data, while the second section contains failure information derived from failure analysis of digital devices. In each of these sections, the data summaries are followed by a detailed listing of line entries which allow the reader to make the maximum use of the information compiled in this compendium. In addition to providing field and test results, MDR-17 presents comparisons between actual field experienced failure rates and MIL-HDBK-217C, Notice 1, predicted failure rates. The use of tables and graphs results in high visibility into the parameters which affect device failure rates, allowing correlation between observed and predicted failure rates to be made effectively.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1981
- Accession Number
- ADA113992