Technical Reliability Studies. EOS/ESD Technology Abstracts

Abstract

The EOS/ESD Technology Abstracts references literature pertinent to Electrical Overstress and Electrostatic Discharge damage or degradation of electronic devices. Aspects encompass design, failure analysis, protective measures and techniques, and training programs.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1981
Accession Number
ADA113994

Entities

People

  • Eugene Kraeger
  • Wayne Grimaldi

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Circuit Analysis
  • Electromagnetic Fields
  • Electronic Components
  • Electronics Industry
  • Electronics Laboratories
  • Failure Mode And Effect Analysis
  • Field Effect Transistors
  • Materials Laboratories
  • Materials Processing
  • Materials Testing
  • Measurement
  • Modules (Electronics)
  • P-N Junctions
  • Power Electronics
  • Semiconductor Devices
  • Semiconductors
  • Varistors

Fields of Study

  • Engineering

Readers

  • Gender and Food Studies
  • Plasma Physics.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems