High Temperature Millimeter Wave Characterization of the Dielectric Properties of Advanced Window Materials.
Abstract
Experimental methods have been developed to determine the dielectric properties of candidate radome materials at 35 and 94 GHz for temperatures up to 1700 C. Measurements have been carried out on fuzed silica, single crystal sapphire, hot-pressed silicon nitride, beryllium oxide and boron nitride as a function of temperature, composition and manufacturing procedures. Dielectric characterization data are presented in tabular and graphic forms to provide the necessary data base for evaluation of millimeter wave transmission properties of these materials in radome applications. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1982
- Accession Number
- ADA115851
Entities
People
- W. W. Ho