A Fast Turn-Around Facility for Very Large Scale Integration (VLSI)

Abstract

In order to appreciate the critical hardware and software problems associated with the definition and design of very large scale integrated circuits or integrated systems including 10 to the 4th power - 10 to the 6th power transistors in a single silicon ship, incisive experiments conducted with actual operating chips are indispensible. The objective of this project is to establish, within a university research environment, a facility for the rapid execution of mask generation, wafer fabrication, and functional testing of user- generated custom I.C. designs.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1982
Accession Number
ADA115863

Entities

People

  • James D. Meindl
  • James D. Plummer
  • John D. Shott
  • R. Fabian Pease
  • Robert W. Dutton

Organizations

  • Stanford University

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Aspect Ratio
  • Bipolar Junction Transistors
  • Chemical Vapor Deposition
  • Circuits
  • Computer Simulations
  • Computers
  • Equations
  • Experimental Data
  • Fabrication
  • Geometry
  • Integrated Circuits
  • Measurement
  • Operating Systems
  • Standards
  • Transistors
  • Two Dimensional
  • Very Large Scale Integration

Readers

  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design