Electrical Characterization of 16K Static RAMS.

Abstract

Bench and automatic techniques are used to characterize the performance of several 16K static RAM types. A binary search method is used in conjunction with an array driven program to determine the operating limits of the AC parameters. For comparison, access time measurements are made using a variety of n2 and shorter test patterns. Several device anomalies are discussed. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1982
Accession Number
ADA116111

Entities

People

  • Daniel W. Mui
  • David A. O'connor
  • James B. Schwehr

Organizations

  • General Electric

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Access Time
  • Automatic
  • Bench Tests
  • Computer Programming
  • Detection
  • High Voltage
  • Impedance
  • Ions
  • Low Voltage
  • Mainframe Computers
  • Measurement
  • Plastic Explosives
  • Resistance
  • Standards
  • Test Equipment
  • Test Methods
  • Unified Combatant Commands

Readers

  • Aerospace Test and Evaluation
  • Nanoscale Plasmonic Nanotechnology
  • Regression Analysis.