In-Situ Measurement of the Properties of Curing Systems with Microdielectrometry.

Abstract

This paper reports the measurement of low frequency dielectric properties of several epoxy-amine systems undergoing cure. Results from isothermal cures of DGEBA-MPDA are shown to provide a measurement of a low-frequency relaxation time that can be correlated with bulk viscosity prior to gelation. Also studied was the effect of PGE diluent in the DGEBA-DDS system. It is shown that as little as 5 phr diluent produces observable changes in the low-frequency dielectric properties. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 04, 1982
Accession Number
ADA116474

Entities

People

  • David R. Day
  • H. L. Lee
  • N. F. Sheppard Jr.
  • S. D. Senturia

Organizations

  • Massachusetts Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Calibration
  • Chemical Engineering
  • Chemistry
  • Dielectric Permittivity
  • Dielectric Properties
  • Electrical Engineering
  • Field Effect Transistors
  • Geometry
  • Glass Transition Temperature
  • Glycidyl Ether
  • Integrated Circuits
  • Materials
  • Materials Science
  • Measurement
  • Relaxation Time
  • Transition Temperature
  • United States

Readers

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  • Polymer Science and Engineering.