Automatic Test Methods for Linear Microcircuits.

Abstract

The objective of this effort was to review MIL-M-38510 operational amplifier and comparator electrical test conditions, and to develop simplified test procedures of these parts on general purpose automatic test equipment. There was an emphasis on gain measurements. However, all parameters were investigated for implementation on ATE as well as the effects of accuracy, repeatability, and chip heating. Modifications to MIL-M-38510 slash sheets are recommended, as well as additions to same. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1982
Accession Number
ADA117594

Entities

People

  • Hans Siepmann
  • Steve Broderick

Organizations

  • Martin Marietta

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Amplifiers
  • Bench Tests
  • Circuits
  • Comparators
  • Data Acquisition
  • Dynamic Tests
  • Feedback Amplifiers
  • Measurement
  • Measuring Instruments
  • Operational Amplifiers
  • Power Supplies
  • Resistance
  • Test And Evaluation
  • Test Equipment
  • Test Fixtures
  • Test Methods

Readers

  • Electronics Engineering
  • Software Engineering
  • Thermal Physics or Thermal Science.

Technology Areas

  • Microelectronics