Finite Element Analysis of Microelectronic Packages.
Abstract
New and innovative methods are being applied to the analysis of the mechanical integrity of microelectronic packages. This study resulted in 1) a summary of commercially available finite element computer programs for both structural and thermal analyses, 2) a categorization of microelectronic problems that can be evaluated using analytical techniques, 3) assessment of applicable analysis techniques, 4) cost comparisons of exposing failure modes by the use of computer analysis rather than physical test, and 4) to provide engineers with a base of technical knowledge necessary for the application of the finite element technique to solve microelectronic reliability problems. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1982
- Accession Number
- ADA117979
Entities
People
- J. R. Southland
- V. R. Beatty
- W. J. Vitaliano
Organizations
- Harris Corporation