An Automated Temperature Controller for the Advanced Hall Effect Experimental Data Acquisition System.

Abstract

The purpose of this study was the development of an automated temperature controller to interface with the automated data acquisition system and the experiment. The temperature controller is designed to control the temperature of the silicon sample to within 0.005 degrees kelvin in the temperature range of 4.2 to 300 degrees Kelvin. The control algorithm measures the thermal impulse response of the system and uses this information to adjust and control the temperature. An MC6809 microprocessor with 10K bytes of EPROM and 640 bytes of RAM is used to implement the controller. The control algorithm and other software was developed to enable the controller to control temperature. A number of problems with the present controller design are identified and recommendations for improvements to the design are made.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1982
Accession Number
ADA118040

Entities

People

  • Daniel John Page

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Sensors

DTIC Thesaurus Topics

  • Acquisition
  • Aeronautical Laboratories
  • Air Force
  • Change Detection
  • Control Systems
  • Data Acquisition
  • Detection
  • Detectors
  • Electrical Engineering
  • Electrical Properties
  • Hall Effect
  • Materials
  • Materials Laboratories
  • Measurement
  • Microprocessors
  • Semiconductors
  • Software Development

Fields of Study

  • Physics

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Robotics and Automation.
  • Thermal Physics or Thermal Science.