Spectrographic Analysis of Iodine Emission

Abstract

The 2-inch I.D. gas dynamic shock tube at the Air Force Institute of Technology, Wright-Patterson AFB, was used to examine the infrared emission spectrum of iodine in the 1.1-1.5 micron range. A reflected shock wave passing through the test gas generated the high temperature that was necessary to dissociate the iodine, and cause infrared emissions. Helium gas was used as the driver gas, and argon gas was used in the driven (test) section of the tube. The infrared emission was passed through a grating spectrometer (1200 lines;mm, 121, 000 total lines) and was detected at the outlet slit with a liquid nitrogen cooled indium-antimonide IR detector. Control tests were run without iodine to verify that the spectrometer and IR detector were working properly during which time strong argon lines were observed. Subsequent tests revealed the infrared emissions characteristics of iodine in the 1.1-1 5 micron range. There is sufficient evidence to suggest that the 1.3151 micron electronic mode was excited; however, there may not have been a high enough energy state to extract energy in the lasing mode. The test section condition that was generated during observation of the 1.3151 micron line was T(5) of approximately 5000 R.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1982
Accession Number
ADA118063

Entities

People

  • James J. Baer

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Energy and Power Technologies
  • Sensors

DTIC Thesaurus Topics

  • Air Force
  • Detectors
  • Electromagnetic Radiation
  • Emission
  • Engineering
  • High Temperature
  • Indium Antimonides
  • Infrared Detectors
  • Instrumentation
  • Laser Applications
  • Lasers
  • Light Sources
  • Measurement
  • Pressure Transducers
  • Shock Tubes
  • Shock Waves
  • Spectra

Fields of Study

  • Physics

Readers

  • Aerospace Propulsion Engineering.
  • Combustion Dynamics and Shock Wave Physics.
  • Spectroscopy.

Technology Areas

  • Microelectronics