Calculation of Cosmic-Ray Induced Soft Upsets and Scaling in VLSI Devices.

Abstract

An analysis was carried out to explore the effect of size reduction on cosmic-ray induced errors in RAM's. This analysis uses a computational model and scaling procedure that are representative of those reported in current literature. Availability of various cosmic-ray environments make it possible to examine the effect of variations in the environment on predicted soft-upset rates. In addition, soft-upset rates have been calculated for the direct ionization due to protons in the radiation belts at an altitude of 600 nautical miles.

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Document Details

Document Type
Technical Report
Publication Date
Aug 26, 1982
Accession Number
ADA118584

Entities

People

  • E. L. Petersen
  • J. H. Adams Jr.
  • P. Shapiro

Organizations

  • United States Naval Research Laboratory

Tags

Communities of Interest

  • Energy and Power Technologies
  • Space

DTIC Thesaurus Topics

  • Air Force
  • Artificial Satellites
  • Complementary Metal-Oxide Semiconductors
  • Continuous Spectra
  • Corporations
  • Cosmic Rays
  • Electrical Engineering
  • Energy Transfer
  • Environment
  • Galactic Cosmic Rays
  • Ionization
  • Radiation
  • Radiation Effects
  • Solar Activity
  • Space Systems
  • Spacecraft
  • Spectra

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Integrated Circuit Design and Technology.
  • Solar Physics