RADC Testability Notebook

Abstract

Testability represents the inherent susceptibility of electronics systems to undergo valid functional performance testing, fault detection and fault isolation, together with the characteristics of the test system mix of Built-in-Test and external test equipments. A high degree of testability is necessary to achieve the highest levels of system performance and availability at least costs of system development and operation since good testability allows for discovery and correction of faulty system operation with the least expenditure of program resources and within acceptable limits of elapsed time. The inherent testability needs to be systematically developed and integrated with the design of the system and the requirements for testability must be accorded the same level of recognition as performance, reliability, maintainability, availability, supportability, and safety. The Testability Notebook provides fundamental guidance for systematic establishment throughout the development cycle of the requisite inherent testability and comprehensive testability of the test resource mix in combination with the prime system design.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1982
Accession Number
ADA118881

Entities

People

  • G. Stratton
  • J. Byron
  • L. Deight

Organizations

  • Hughes Aircraft Company

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Ground and Sea Platforms
  • Human Systems
  • Weapons Technologies

DTIC Thesaurus Topics

  • Application Software
  • Circuit Boards
  • Computer Programming
  • Computer Programs
  • Computers
  • Engineers
  • Failure Mode And Effect Analysis
  • Life Cycles
  • Logic Gates
  • Logistics
  • Maintenance
  • Organizational Structure
  • Performance Tests
  • Systems Engineering
  • Test And Evaluation
  • Test Equipment
  • Test Methods

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Fault Tolerant Diagnosis of Black and White Balloon Isolation Tests Using ¥.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics