Microcircuit Device Reliability Memory/Digital LSI

Abstract

This book contains data on memory and digital LSI device failure rates. The raw data is presented as well as a series of summaries designed to bring out the salient points. Where possible, graphical aids are used to depict the data. Comparison of predicted with observed failure rates is given, predictions being carried out to MIL-HDBK-217C. This book includes a new section on failure analysis results not included in previous editions.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1982
Accession Number
ADA119359

Entities

People

  • Kieron A. Dey
  • Wayne E. Turkowski

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Computers
  • Confidence Limits
  • Databases
  • Department Of Defense
  • Electronic Equipment
  • Failure Analysis
  • Failure Mode And Effect Analysis
  • Field Tests
  • Governments
  • Life Tests
  • Materials
  • Metal Oxide Semiconductors
  • Metal Oxides
  • Semiconductors
  • Shift Registers
  • Test And Evaluation
  • X Rays

Readers

  • Business Analytics
  • Inertial Navigation Systems.
  • Integrated Circuit Design and Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems