Investigation of Mechanisms in Field-Desorbed Ion Formation Using a Pulsed Field Desorption Time-of-Flight Mass Spectrometer.
Abstract
A pulsed field desorption time-of-flight mass spectrometer was designed and tested. Second-order energy focusing was achieved using a two-stage electrostatic reflector. Ions were formed by applying a 80-150 ns negative pulse of 2200 volts to a counter electrode spaced 50-200 micrometers away from either silicon or carbon activated emitters. The interaction of the high voltage pulse with the ion packet caused a large spread in the ion energy and limited mass resolution to only 400 at m/z 152. In separate experiments using a pulsed laser to produce ions, a time resolution of 1450 was obtained at m/z 242. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1982
- Accession Number
- ADA119635
Entities
People
- S. E. Buttrill Jr.
Organizations
- SRI International