Photo Field Emission and Field Emission Energy Distributions from Silicon.

Abstract

Experimental field emission energy distributions (FEEDs) are reported for both n- and p-type samples of low resistivity. The experimental distributions are characterized by a high intensity single peak, of energy 0.4 eV or more below the Fermi level, with a subsidiary peak of lower intensity, rising from just below the Fermi level. The larger peak drops in energy with increasing field. Experimental FEEDs are compared to those expected theoretically. It is concluded that they are not similar. Comparison with photoemission work indicates that the large peak is due to a band of surface acceptor states. The subsidiary peak is tentatively ascribed to conduction band electrons. Finally, a phenomenological model of photo-field emission (PFE) is proposed. Based upon both FEED and PFE experiments, this model assumes that emission occurs primarily from surface states. A second component of the current is due to tunnelling of photogenerated electrons. In addition to photoconductivity, a self-regulating break-down mechanism is necessary for qualitative agreement with experimental data. One such mechanism, avalanche, is investigated for the dielectric emitter model. Qualitative agreement is obtained with the characteristic non-linear Fowler-Nordheim behavior observed experimentally.

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Document Details

Document Type
Technical Report
Publication Date
Jul 13, 1982
Accession Number
ADA119896

Entities

People

  • Michael H. Herman

Organizations

  • Pennsylvania State University

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Acquisition
  • Band Structures
  • Computers
  • Conduction Bands
  • Data Acquisition
  • Electronics
  • Electrons
  • Emission
  • Emitters
  • Energy Bands
  • Experimental Data
  • Fermi Levels
  • Field Emission
  • Measurement
  • Semiconductors
  • Surface Properties
  • Valence Bands

Readers

  • Materials Science and Engineering.
  • Plasma Physics.

Technology Areas

  • Microelectronics