Collision Studies on Multiply Charged Ions.

Abstract

Gaseous discharges contains ions in a number of charge states. Collisions between these ions and atoms in the discharge result in the production of excited ions and atoms as well as free electrons. Single electron capture collisions involving doubly charged ions with atoms are particularly important in determining the behavior of the discharge since they result in two ions with one generally in an excited state. Such collisions are not well understood. In this context we have studied electron capture in Ar(2+) + Ar because of the importance of argon as a discharge gas and because there were substantial difficulties in understanding single electron capture processes in the collision. Our laboratory has measured the cross sections for the important final channels in the single electron capture collisions as well as the direct scattering and for the double electron capture cases. It is particularly interesting that the direct scattering does not occur with Ar target excitation as was found in Ar(+) + Ar. We have also shown that long lived highly excited states of Ar(2+) make important contributions to the charge exchange. We interpret our results and propose a simple model of the collision.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1982
Accession Number
ADA120430

Entities

People

  • Edward Pollack

Organizations

  • University of Connecticut

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Analyzers
  • Atoms
  • Collisions
  • Crossings
  • Detectors
  • Differential Cross Sections
  • Electron Capture
  • Electron Transitions
  • Electrons
  • Energy
  • Free Electrons
  • Ground State
  • Inelastic Scattering
  • Particle Collisions
  • Potential Energy
  • Scattering
  • Transitions

Fields of Study

  • Physics

Readers

  • Pulsed Power and Plasma Physics.
  • Quantum spin resonance or Electron Paramagnetic Resonance spectroscopy.
  • Solar Physics

Technology Areas

  • Microelectronics