Technical Reliability Studies. EOS/ESD Technology Abstracts

Abstract

The EOS/ESD Technology Abstracts is a bibliography of approximately 400 papers, reports and articles related to the subject of electrical overstress/electrostatic discharge. The intent of this bibliography is to make more accessible the present information on the subject of EOS/ESD, such as design, failure analysis, protective measures and techniques, and training programs. The cut-off date for inclusion of material was March, 1982. The 400 abstracts represent a 50% increase in content over TRS-3.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1982
Accession Number
ADA121014

Entities

People

  • John P. Farrell
  • William K. Denson

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Aging (Materials)
  • Chemical Synthesis
  • Chemistry
  • Electromagnetic Fields
  • Electronic Components
  • Electronics Industry
  • Electronics Laboratories
  • Failure Mode And Effect Analysis
  • Field Effect Transistors
  • Material Degradation Processes
  • Materials Laboratories
  • Materials Processing
  • Materials Science
  • Materials Testing
  • Modules (Electronics)
  • Power Electronics
  • Semiconductors

Fields of Study

  • Engineering

Readers

  • Library and Information Science
  • Systems Analysis and Design