Analytical Redundancy and the Design of Robust Failure Detection Systems,
Abstract
The Failure Detection and Identification (FDI) process is viewed as consisting of two stages: residual generation and decision making. It is argued that a robust FDI system can be achieved by designing a robust residual generation process. Analytical redundancy, the basis for residual generation, is characterized in terms of a parity space. Using the concept of parity relations, residuals can be generated in a number of ways and the design of a robust residual generation process can be formulated as a minimax optimization problem. An example is included to illustrate this design methodology.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 14, 1982
- Accession Number
- ADA121771
Entities
People
- Alan S. Willsky
- Edward Y. Chow
Organizations
- Massachusetts Institute of Technology