Combined Environment Testing of Terminal Protection Devices Conjoined with Basic Integrated Circuits.
Abstract
The objectives of this program were to develop an experimental method and conduct a series of tests to evaluate the effectiveness of terminal protection devices in a combined conducted current and ionizing radiation environment. An essential requirement of the test effort was to include a statistically significant number of test samples. A pulser design comprised of a charged coaxial line and a radiation-triggered SCR switch was selected. This design was assembled into a 4-channel configuration which was used to conduct combined environment tests. The facility provided a prompt dose of about 3500 rads(Si) in the test circuits, and about 750 rads(Si) in the radiation-triggered pulser. The test program encompassed 176 samples of the same type integrated circuit in various test configurations. For tests without terminal protection devices in place, the results indicate that current and power failure thresholds are slightly higher for a combined environment. Test results for configurations with terminal protection devices are somewhat incomplete because of the inability to induce a large number of failures. For the one configuration where a few failures were observed, test results indicate that terminal protection devices are more effective (by a current margin of 7 dB or greater) in a combined environment than for conducted current only. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 22, 1981
- Accession Number
- ADA122210
Entities
People
- Philip S. Book
Organizations
- Kaman Corporation