Development of a High-Resolution Thermoprobe.

Abstract

A method is being developed for measuring temperature with very high spatial (0.5 micron) and temporal (10 ns) resolution. This method, which exploits the light absorption characteristics of semiconductors, is of interest for studying the temperature rises associated with high-rate material deformation processes such as rapid crack propagation, sliding friction and wear, and shock-induced detonation of explosives. This report discusses the analytical and experimental examination of the temperature response of CdS single crystals and vapor-deposited polycrystalline films. A temperature sensitivity of 0.03K and a range of 300K were obtained. These values depended strongly on film thickness, film vapor-deposition processes, and post-deposition annealing, showing that sensitivity and range can be tailored somewhat for specific applications.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1983
Accession Number
ADA123994

Entities

People

  • D. A. Shockey
  • T. Kobayashi

Organizations

  • SRI International

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Artificial Intelligence
  • Climate Change
  • Detectors
  • Dye Lasers
  • Films
  • Heat Treatment
  • High Resolution
  • Lasers
  • Light Sources
  • Materials
  • Military Research
  • Monochromatic Light
  • Nanosecond Time
  • Semiconductors
  • Single Crystals
  • Temperature Gradients
  • Vapor Deposition

Fields of Study

  • Materials science

Readers

  • Fluid Mechanics and Fluid Dynamics.
  • Materials Science (Mechanical Engineering).
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene