Diffraction from Overlayer Islands with Positional Correlation.
Abstract
By presenting the autocorrelation functions with a set of delta-functions in the method developed by Houston and Park, closed-form solutions are obtained for the angular distribution of diffracted intensity, in the kinematic approximation, from commernsurately adsorbed overlayer islands with positional correlation. It is shown, for islands with unit mesh larger than that of the substrate, that the interference between the islands has only a minor influence on the angular distribution of the superlattice beam intensity if the islands have short-range correlations in their position. Although interference effects are present in the line shape for islands with long-range positional correlation, it is shown that these are not measurable unless a very narrow detector is used. The results are applicable to LEED, RHEED, and grazing-angle x-ray diffraction measurements.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 20, 1983
- Accession Number
- ADA124038
Entities
People
- G.-c. Wang
- J. E. Houston
- L.-h. Zhao
- M. G. Lagally
- T.-m. Lu
Organizations
- University of Wisconsin–Madison