Photoluminescence Study of N-Type Thermal Conversion in Semi-Insulating GaAs.
Abstract
Chromium doped SI GaAs samples annealed at temperatures from 650 C to 950 C were examined for n-type thermal conversion. From Van der Pauw Hall measurements, it was determined that the samples annealed at 850 C, 900 C and 950 C thermally converted. These converted samples were then subjected to resistivity profile measurements to determine the extent of the thermally converted layer. Depth resolved photoluminescence was also used to observe changes in the spectra as surface layers from the converted samples were removed. Although changes in the spectra were observed, none could be related to thermal conversion. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1982
- Accession Number
- ADA124772
Entities
People
- John A. Guillen
Organizations
- Air Force Institute of Technology