Evaluation of a Detection System Employing Two Silicon Semiconductors for the Analysis of Radioactive Noble Gases.
Abstract
This report presents a study of the characteristics of a radiation detection system for the analysis of radioactive noble gases. The sample gas is condensed in a chamber between two planar lithium-drifted silicon semiconductor detectors. The analysis was limited to two radioisotopes of xenon, 131mXe and 133Xe, which are produced in nuclear fission. Xray spectroscopy was used in an attempt to quantify 131mXe in the presence of 133Xe. In previous research using this system, the sample gas deposited itself in the sample chamber in an uneven and unpredictable manner. Modifications were made to the sample chamber and the gas now deposits itself predictably and reproducibly. Also, the effects of self-absorption and carrier gas x-ray fluorescence were analyzed and quantified. Finally, it was found that the system could quantify 131mXe in the presence of 133Xe using a simple three step procedure. Recommendations were made for further study with this system. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1982
- Accession Number
- ADA124796
Entities
People
- Wayne Linwood Andrews Jr
Organizations
- Air Force Institute of Technology