Design, Fabrication and Test of an Integrated Built-In-Test (BIT) Control Unit.

Abstract

This report describes the design of an integrated Built-In-Test (BIT) control unit which may be interfaced with selected missile control subsystems. The control unit design provides the capability to perform tests of the subsystem operational integrity at time of turn-on and continually monitors system operation. In addition, the control unit design provides the capability to perform limited fault diagnosis and isolation to a replaceable assembly. The control unit design provides both a visual display and voice output to alert the operator of a detected malfunction. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1982
Accession Number
ADA127278

Entities

People

  • Edwin K. Thomas
  • Thomas R. Hoop

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Acquisition
  • Central Processing Units
  • Computer Programming
  • Connectors
  • Corporations
  • Data Acquisition
  • Demographic Cohorts
  • Detection
  • Fabrication
  • Host Computers
  • Measurement
  • Power Supplies
  • Systems Management
  • Test And Evaluation
  • Test Equipment
  • Test Methods
  • Waveforms

Fields of Study

  • Engineering

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
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  • Integrated Circuit Design and Technology.