State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume I. Executive Summary.
Abstract
This project is a two-phase study dealing with testing and testability of custom LSI/VLSI circuits. The tasks summarized and evaluated in this report consisted of compiling and documenting a survey and assessment of the state-of-the-art for each of seven topics. Each of these topics has resulted in a formal report and are listed below: Vol. 2: Hardware Design Verification; Vol. 3: Fault Mode Analysis; Vol. 4: Test Generation; Vol. 5: Design for Testability; Vol. 6: Redundancy, Testing Circuits, and Codes; Vol. 7: Built-in Testing (BIT) and Built-in Test Equipment (BITE); and Vol. 8: Fault Simulation.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1982
- Accession Number
- ADA127984
Entities
People
- Al J. Carlan
- M. A. Breuer
Organizations
- The Aerospace Corporation