State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume IV. Test Generation.

Abstract

Two major approaches are considered for generating tests for digital systems: methods based on detailed circuit models of the unit under test (UUT) and methods based primarily on a functional description of the UUT. In addition to test generation of general digital systems, the testing requirements of microprocessors, semiconductor memories and PLA are examined. The D-algorithm and several variants are discussed as a basis for practical test generation procedures. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1982
Accession Number
ADA127985

Entities

People

  • Al J. Carlan
  • M. A. Breuer

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Energy and Power Technologies
  • Space

DTIC Thesaurus Topics

  • Algorithms
  • Circuit Analysis
  • Circuit Testers
  • Computer Programming
  • Computer Science
  • Computers
  • Data Storage Systems
  • Digital Circuits
  • Failure Mode And Effect Analysis
  • Logic
  • Logic Gates
  • Microprocessors
  • Nand Gates
  • Semiconductors
  • Simulators
  • Test Equipment
  • Test Methods

Readers

  • Integrated Circuit Design and Technology.
  • Software Engineering

Technology Areas

  • Microelectronics