State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume VIII. Fault Simulation.
Abstract
Fault simulation is widely used by industry in such applications as scoring the fault coverage of test sequences and construction of fault dictionaries. For use in testing VLSI circuits a simulator is evaluated by its accuracy i.e. modelling capability. To be accurate simulators must employ multi-valued logic in order to represent unknown signal values, impedance, signal transitions etc, circuit delays such as transport rise/fall, inertial, and the fault modes it is capable of handling. Of the three basic fault simulators now in use (parallel, deductive and concurrent) concurrent fault simulation appears most promising. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1982
- Accession Number
- ADA128019
Entities
People
- A. J. Carlan
- M. A. Breuer
Organizations
- The Aerospace Corporation