The Development and Evaluation of Point Defect Models for the Growth of Passive Films on Single Crystal, Polycrystalline, and Amorphous Metal Surfaces.

Abstract

This research program was undertaken to provide data with which to test the validity of the point defect model developed by macdonald and co-workers to describe the growth and breakdown of films on metals. The study is comprised of two tasks. Task 1 is an investigation of the growth of passive films on nickel and iron in phosphate solutions whereas Task 2 is concerned with the film breakdown behavior on single crystal and polycrystalline metals (Ni, Fe) and alloys (Fe-Ni, Fe-Ni-Cr) in borate buffer solutions with chloride present. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Feb 28, 1983
Accession Number
ADA128333

Entities

People

  • B. G. Pound
  • D. D. Macdonald
  • Kuan-shaur Lei
  • Ru-yu Liang

Organizations

  • Ohio State University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Buffers (Chemistry)
  • Coefficients
  • Crystal Structure
  • Crystals
  • Current Density
  • Electrochemical Cells
  • Electrodes
  • Electropolishing
  • Frequency
  • Impedance
  • Measurement
  • Point Defects
  • Polycrystals
  • Refractive Index
  • Single Crystals
  • Steady State
  • Surface Properties

Readers

  • Calculus or Mathematical Analysis
  • Materials Science and Engineering.
  • Thin Film Deposition Science.