Relationship between Manufacturing Yields and Field Failure Rates of Electronic Equipment.

Abstract

This research seeks to determine the degree of correlation between manufacturing yields and field failure rates (operational reliability) of electronic equipment. A designated set of line replaceable units (LRUs) within the avionic subsystems of the A-10A; F-4C/D/E; F-15C and F-16A/B is selected as pilot items in this study, with prime emphasis on the reliability of the printed circuit boards (PCBs) within these units. In Phase I, the data base needed to measure this correlation is established. In Phase II, correlations among these data will be sought. Based on the significance of these correlations, recommendations will be formulated in Phase III to use these research results in Production Readiness Reviews (PRRs) and Risk Assessments for future acquisitions of electronic equipment. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1983
Accession Number
ADA128498

Entities

People

  • Eugene E. Jones
  • John M Pearson

Organizations

  • University of Dayton

Tags

Communities of Interest

  • Air Platforms
  • Materials and Manufacturing Processes
  • Weapons Technologies

DTIC Thesaurus Topics

  • Acquisition
  • Air Force
  • Air Force Facilities
  • Aircrafts
  • Circuit Boards
  • Databases
  • Electronic Equipment
  • Failure Mode And Effect Analysis
  • Logistics
  • Manufacturing
  • Plastic Explosives
  • Printed Circuit Boards
  • Printed Circuits
  • Production
  • Quality Control
  • Reliability
  • Risk Analysis

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Integrated Circuit Design and Technology.
  • Logistics and Supply Chain Management.

Technology Areas

  • Microelectronics