State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume VII. Built-In Testing (BIT) and Built-In Test Equipment (BITE).

Abstract

Concurrent testing and nonconcurrent testing are the two major BIT techniques employed in VSLI circuit design; concurrent testing and nonconcurrent testing. concurrent testing allows circuit checkout during normal system; and may employ error detecting codes, self checking circuits, replication or electrical monitoring. Nonconcurrent testing requires a special test mode during which normal system operation is halted. Circuits must be added to generate the test patterns used during test mode. Circuits must be added to generate the test patterns used during test mode. Nonconcurrent testing is initiated by hardware implemented BITE or diagnostic software. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1982
Accession Number
ADA128587

Entities

People

  • Al J. Carlan
  • M. A. Breuer

Organizations

  • The Aerospace Corporation

Tags

DTIC Thesaurus Topics

  • Behavior And Behavior Mechanisms
  • Behavioral Disciplines And Activities
  • Behavioral Sciences
  • Cooperation
  • Group Dynamics
  • Monitoring
  • Test Equipment

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Computer Programming and Software Development.
  • Integrated Circuit Design and Technology.