Plasma-Enhanced Deposition and Processing of Transition Metal Silicides.
Abstract
Radiofrequency (rf) discharges of tungsten hexafluoxide/hydrogen or molybdenum/hexafluoride/hydrogen have been used to deposit films of tungsten or molybdenum. The tungsten depositions resulted in high purity films with as-deposited resistivities ranging from 40 to 170 micron omega cm, depending upon the deposition conditions. Short (<20 min) heat treatments in hydrogen/nitrogen atmospheres at temperatures above 700 deg C resulted in a decrease in the resistivity of the films to approximately 8 micron omega-cm, essentially independent of the initial film resistivity. Unlike tungsten, molybdenum films displayed high (>10,000 micron omega cm) resistivities. These results were due to approximately 15 atomic percent fluorine incorporated into the film structure during deposition. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 25, 1983
- Accession Number
- ADA128817
Entities
People
- Dennis W. Hess
Organizations
- University of California, Berkeley