U.S. Army Intelligence Center and School USAICS, Software Analysis and Management System USAMS, Correlation Algorithm Report.

Abstract

This is one in a series of algorithm analysis reports on work performed at the Jet Propulsion Laboratory for the US Army Intelligence Center and School covering selected algorithms in existing Intelligence and Electronic Warfare (IEW) systems. It focuses on self-correlation algorithms in five ELINT systems. These algorithms test a newly reported sighting against information already gathered to determine whether it represents a battlefield entity previously reported. In the systems surveyed (BETA, TCATA, ELINT PROCESSOR, ITEP, QUICKLOOK, AGTELIS) these decision tests were found to be mainly quasi-statistical using location, detection time, and various signal parametrics. The analysis focuses on the underlying assumptions (such as independence of sightings) which must hold for decisions based on these tests to be valid, the environmental factors (such as information available to the test) necessary for the assumptions to hold and failure modes when some of the assumptions are relaxed.

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Document Details

Document Type
Technical Report
Publication Date
Sep 15, 1982
Accession Number
ADA129181

Entities

People

  • James W. Gillis
  • John R. Radbill
  • Martha Ann Griesel

Organizations

  • Jet Propulsion Laboratory

Tags

Communities of Interest

  • C4I
  • Materials and Manufacturing Processes
  • Sensors
  • Weapons Technologies

DTIC Thesaurus Topics

  • Algorithms
  • Data Analysis
  • Data Mining
  • Data Science
  • Databases
  • Electromagnetic Radiation
  • Electronic Intelligence
  • Information Processing
  • Information Science
  • Jet Propulsion
  • Knowledge Management
  • Radar Signals
  • Random Variables
  • Statistical Algorithms
  • Statistical Inference
  • Statistical Tests
  • Warfare

Fields of Study

  • Computer science

Readers

  • Geospatial Intelligence and Artificial Intelligence Analytics
  • Regression Analysis.
  • Sensor Fusion and Tracking Systems.

Technology Areas

  • Microelectronics