Use of Holographic Linear Fringe Linearization Interferometry (FLI) for Detection of Defects.
Abstract
This report describes the progress during Phase I on the two step Holographic Fringe Linearization Interferometry (FLI) Study. The FLI process consists of deflecting the object beam between holographic exposures to create linear fringes and spatially filtering of the image reconstructed from the hologram to discriminate between subsurface defects and random fringe noise. The fringe localization procedures utilized to put the linear fringes on the surface of interest are described. The design of the repeatable thermal deformation procedures used in the preliminary experiments are discussed. The design of both the holographic recording, reconstruction and spatial filtering systems are given. Preliminary experimental results show the separation of linear fringe information and random noise in the Fourier plane of the spatial filtering system. Various filter designs which enhance the images are also discussed. System feasibility is demonstrated for a triple exposure experiment in which controlled noise was added with a third exposure. Controlled loading experiments are shown to agree with the results predicted analytically with a simple bending finite element model. Plans for the work in Phase II are presented. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 1983
- Accession Number
- ADA129323
Entities
People
- Donald A. Servaes
- George O. Reynolds
- John G. Develis
- Ronald A. Mayville
Organizations
- Honeywell International, Inc.