Metal-Insulator-Metal Junctions as Surface Sources of Intermodulation

Abstract

This program was performed to investigate metal-insulator-metal (MIM) junctions as surface sources of intermodulation (IM) on Command, Control, Communications, and Intelligence (C3I) aircraft. The IM levels generated by MIM junctions were evaluated for various material and physical parameters of the junctions as well as electromagnetic properties of the applied signals. A total of 57 test samples were fabricated to be representative of MIM junctions which are found on aircraft. The IM levels of these junctions were measured using a previously developed measurement scheme. Models were developed which describe the IM behavior as a function of some of the parameters. These parameters include input power, temperature, pressure, material and construction of the MIM junction. The changes due to other parameters were smaller than the variability of the data for a single test sample. In order to verify the model, two additional test samples were constructed, measured, and compared to predicted values.

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1983
Accession Number
ADA130451

Entities

People

  • J. A. Woody
  • T. G. Shands

Organizations

  • Georgia Tech

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Aircrafts
  • Aluminum Alloys
  • Bandpass Filters
  • Coaxial Cables
  • Detectors
  • Electromagnetic Radiation
  • Frequency
  • Materials
  • Measurement
  • Plastic Explosives
  • Power Levels
  • Semiconductor Devices
  • Semiconductors
  • Standards
  • Surface Finishing
  • Verification Tests

Readers

  • Acoustics.
  • Electronics Engineering
  • Solar Photovoltaics and Thermoelectric Devices.

Technology Areas

  • Fully Networked C3
  • Microelectronics