The Measurement of Residual Stress with X-Ray Diffraction

Abstract

A concise summary of the application of X-ray diffraction principles involved in the measurement of residual stresses is presented for those users of this technique having little exposure to this field. The latest developments in X-ray diffraction residual stress analysis, XRDRSA, are applied in simplified form so that this report can serve as a working manual. Five general areas are considered, namely: theory, history and progress, technical problems, apparatus, and examples of specific problems involving the measurement of residual stresses using X-ray diffraction procedures. Much of the material presented is the result of research (6.1) and Materials Testing Technology (MTT) projects conducted at AMMRFC and was presented at a seminar at the Naval Air Rework Facility in San Diego, Calif. on 18 and 19 November, 1981.

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1983
Accession Number
ADA130614

Entities

People

  • Charles P. Gazzara

Organizations

  • United States Army Research Laboratory

Tags

Communities of Interest

  • Air Platforms
  • Weapons Technologies

DTIC Thesaurus Topics

  • Crystal Lattices
  • Crystal Structure
  • Crystallography
  • Crystals
  • Detectors
  • Diffractometers
  • Distortion
  • Geometry
  • Grain Size
  • Materials
  • Materials Testing
  • Measurement
  • Mechanics
  • Surface Properties
  • Test Methods
  • X Rays
  • X-Ray Detectors

Readers

  • Academic Conference Management
  • Structural Health Monitoring of Composite Structures.
  • Systems Analysis and Design