Thermal Property Measurement Techniques and some Results for CdTe
Abstract
The objective of this study is to measure the thermal properties of several semiconductor materials. Some of the materials of interest are mercury telluride, cadmium telluride and gallium arsenide. The thermal properties to be measured include thermal conductivity, specific heat, coefficient of expansion, heat of fusion and emissivity. These properties are to be measured over a range of temperature levels. Because of the range of temperature levels required, some modificaton of equipment is underway. A literature review has been made to find existing data on the thermal properties of semiconductors; it has been found that little data exists. The thermal properties are being measured in the laboratory using equipment described in the report. The thermal conductivity is measured using the guarded hot plate method, the specific heat and heat of fusion is measured using a gradient layer calorimeter, the expansion coefficient is measured using a quartz dilatometer and the emissivity is measured using a two disc system that is described in the report.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 10, 1983
- Accession Number
- ADA131455
Entities
People
- D. J. Connelly
- H. F. Poppendiek
- R. K. Livett