Internal Noise of Low-Frequency Preamplifiers.

Abstract

Experimental measurements of low frequency preamplifiers show that a type LM394 bipolar input stage has less internal input noise than the popular PAR-113 commercial amplifier for source resistances under 1000 ohms. A type 2N6483 JFET design shows similar input noise to the PAR-113. The input current noise of the JFET design is insignificant compared with the Nyquist noise of the source resistance. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Aug 15, 1983
Accession Number
ADA131532

Entities

People

  • Steven W. Smith

Organizations

  • University of Utah

Tags

Communities of Interest

  • Advanced Electronics
  • Ground and Sea Platforms
  • Weapons Technologies

DTIC Thesaurus Topics

  • Amplifiers
  • Bipolar Junction Transistors
  • Chemical Engineering
  • Chemistry
  • Electronics
  • Engineering
  • Jet Propulsion
  • Low Noise
  • Materials
  • Materials Science
  • Measurement
  • Mechanical Engineering
  • Military Research
  • New Jersey
  • New York
  • Resistance
  • Standards

Fields of Study

  • Physics

Readers

  • Acoustics.
  • Electronics Engineering