Silicide Formation and Schottky Barrier of Rare-Earth Metals on SI

Abstract

The objectives of this program are to investigate the electrical properties and growth characteristics of rare-earth silicides that potentially form low energy barriers on n-type Si. A more general objective is to set up Rutherford backscattering spectrometry at UCSD. For the investigation of rare- earth silicides, we concentrate working on ErSi2 (all rare-earth silicides are similar in characteristics and properties, Er is slightly less reactive with oxygen). More recently GdSi2 has also been investigated. We report here the results of our investigation. Generally speaking, we believe that the major problems of rare-earth silicides have been solved. Rutherford backscattering spectrometry is now on-line at UCSD.

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Document Details

Document Type
Technical Report
Publication Date
Sep 30, 1983
Accession Number
ADA131750

Entities

People

  • S. S. Lau

Organizations

  • University of California, San Diego

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Chemical Analysis
  • Chemistry
  • Critical Temperature
  • Crystal Structure
  • Diffraction
  • Electrical Properties
  • Glass Transition Temperature
  • Heat Energy
  • Latent Heat
  • Materials
  • Metal-Semiconductor Junctions
  • Nuclear Reactions
  • Phase Transformations
  • Schottky Diodes
  • Semiconductors
  • Spectra
  • Transition Temperature

Readers

  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Materials Science and Engineering.
  • Surface Engineering/Surface Coating Technology.